Contributed Talk  - Thursday, 16 September I 10:00 AM (CEST)

Prof. Dr. Christian Teichert: "Semi-quantitative Magnetic Force Microscopy investigation of iron-rich phyllosilicates in the monolayer limit"

A. Matković1, L. Ludescher1, O. E. Peil2, A. Sharma3, K.-P. Gradwohl1, M. Kratzer1, L. Romaner2, D. R. T. Zahn3, G. Salvan3, J. G. Raith4, C. Teichert1

1 Institute of Physics, Montanuniversität Leoben, Franz Josef Strasse 18, 8700 Leoben, Austria

2 Materials Center Leoben Forschung GmbH (MCL), Roseggerstrasse 12, 8700 Leoben, Austria

3 Semiconductor Physics, Chemnitz University of Technology, Reichenhainer Strasse 70, D-09107 Chemnitz, Germany.

4 Chair of Resource Mineralogy, Montanuniversität Leoben, Peter-Tunner-Strasse 5, 8700 Leoben, Austria

teichert@unileoben.ac.at

Layered silicate minerals, so-called phyllosilicates, were recently proposed as naturally occurring sources of 2D van der Waals (vdW) materials [1]. By mechanical exfoliation from a mineral agglomerate containing also magnetite and hematite, we were able to prepare on silicon oxide/silicon substrates mono- and few-layer flakes of talc where about 13 % of magnesium where replaced by iron from the surrounding. By executing magnetic force microscopy measurements in external out-of-plane magnetic fields up to 0.5 T, we were able to semi-quantitatively measure the magnetic response of these materials in dependence of the applied fields and the lift height down to the monolayer limit.

 

[1] R. Frisenda, et al. "Naturally occurring van der Waals materials." npj 2D Materials and Applications 4 (2020) 1-13.